Plasmon-phonon interaction in MgxZn1-xO/SiC structures: effect of chemical composition and thickness of the film

dc.contributor.authorMelnichuk, Olexandr
dc.contributor.authorMelnichuk, Lyudmyla
dc.contributor.authorKorsunska, Nadiia
dc.contributor.authorKhomenkova, Larysa
dc.contributor.authorTorchynska, Tetyana
dc.date.accessioned2021-11-08T21:12:28Z
dc.date.available2021-11-08T21:12:28Z
dc.date.issued2019
dc.description.abstractAbstract for XXVIII International Materials Research Congress, IMRC 2019, 18-23 August, 2019, Cancun, Mexico.en
dc.identifier.citationPlasmon-phonon interaction in MgxZn1-xO/SiC structures: effect of chemical composition and thickness of the film / Oleksandr Melnichuk, Lyudmyla Melnichuk, Nadiia Korsunska, Larysa Khomenkova, Tetyana Torchynska // XXVIII International Materials Research Congress, IMRC 2019, 18-23 August, 2019, Cancun, Mexico. - Ciudad de México : Sociedad Mexicana de Materiales : Warrendale : Materials Research Society, 2019.en
dc.identifier.urihttps://ekmair.ukma.edu.ua/handle/123456789/21449
dc.language.isoukuk_UA
dc.relation.sourceXXVIII International Materials Research Congress, IMRC 2019, 18-23 August, 2019, Cancun, Mexico.en
dc.statusfirst publisheduk_UA
dc.subjectMgZnOen
dc.subjectplasmon-phonon interactionen
dc.subjectsurface polaritonen
dc.subjectconference abstracten
dc.titlePlasmon-phonon interaction in MgxZn1-xO/SiC structures: effect of chemical composition and thickness of the filmen
dc.typeConference materialsuk_UA
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