Кафедра фізико-математичних наук

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Browsing Кафедра фізико-математичних наук by Subject "attenuated total reflection"

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    Magnetically tunable surface phonon polaritons in ZnO and ZnO:Mn ceramics
    (2025) Melnichuk, Olexandr; Korsunska, Nadiia; Melnichuk, Lyudmyla; Khomenkova, Larysa
    The excitation conditions and spectra signatures of surface phonon polaritons and plasmon–phonon polaritons in ZnO and Mn-doped ZnO ceramics have beentheoretically analyzed and experimentally probed. Specular infrared reflection and attenuated total reflection spectroscopy were employed to investigate their dispersion relations. A single-oscillator model was used to describe the dielectric permittivity of ZnO ceramics, accounting for additive phonon and plasmon contributions. Theoretical and experimental dispersion curves were examined in the 100–4000 cm−1 and 240–4000 cm−1 spectral range, respectively. Additionally, the effect of an external magnetic field on surface polaritons was explored, revealing magnetically tunable optical responses. These findings contribute to the development of ZnO-based plasmonic and photonic devices, particularly in infrared and terahertz applications.
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    Surface polaritons in optical-anisotropic MgxZn1-xO/6H-SiC structures
    (2020) Melnichuk, O.; Melnichuk, L.; Korsunska, Nadiia; Khomenkova, Larysa; Venger, Y.
    Theoretical modeling of the excitation and propagation of surface phonon (plas monphonon) polaritons in MgxZrij_xO/6H-SiC structure was performed using a multi-oscillator model, which takes into account the additive contribution of the phonon and plasmon-pho- non subsystem parameters to the dielectric permittivity of the material. The simulation was carried out for both Mg^n^O films and 6H-SiC substrates with different free carrier concentrations. It was determined the frequency windows where surface polaritons of different types can be excited. The dispersion dependences for Мд^п^О/бН-SiC structure were obtained taking into account the interaction of the phonon and plas mon-phonon subsystems of the film and the substrate. A three-dimensional representation of reflection coefficient of this structure was constructed.